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Optical Spectrum Analyzers (OSA) for WDM and ROADM Testing

Industry leading solutions for testing CWDM/DWDM and ROADM based systems up to 100GBps
JDSU offers a full range of OSAs tailored for spectral measurements in CWDM systems in the access network as well as DWDM systems in high-speed backbone networks with datarates up to 40Gbps or 100Gbps. The range features an OSA for testing ROADM-based systems, providing true OSNR measurements based on JDSU’s unique in-band OSNR method.
  • New OSA-320 with in-band OSNR method to measuring the true OSNR in      ROADM based systems.
  • Internal online wavelength calibration guarantees highest wavelength accuracy      and requires no recalibration, thus significantly reducing service costs.
  • OSA
  • High filter selectivity and lab optical performance over the full band, from 1250 to 1650nm, in a field-modular design
  • Applications
  • Measurement of the true-OSNR in Agile Optical networks including ROADMs and dispersion compensating modules.
  • DWDM and CWDM system testing during installation, maintenance, and network upgrade.
  • Automated DWDM passive and active component testing.
  • System verification testing according to the customer's preset limits.
  • Verification of ROADM configurations in Agile Optical Networks
  • Full-band optical spectrum analyzer for the ONT platform, the MTS-8000 tester, the T-BERD 8000 tester, the MTS-6000      tester and the T-BERD 6000 tester.
  • Key Features
  • New Optical Polarization Splitting method (OPS-method, JDSU pat pending) for measuring the true in-band OSNR in      ROADM based networks.
  • Future-proof design with a wide tuning range of 1250 to 1650 nm that is suitable for all optical DWDM and CWDM (Metro)      networks up to 100GBps.
  • Channel drop option for troubleshooting and fault location. lsolation of a single channel out of the entire spectrum for      further in-depth signal analysis with BERT or a Q-factor meter.
  • Software option for PMD testing based on the fixed analyzer PMD test method.
  • Built-in optical component test applications for laser diodes, LEDs, and optical amplifiers.
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